Vai al contenuto
L’azienda
Politica Aziendale
Codice Etico
Certificazioni
Prodotti
Microscopi Elettronici a Scansione (SEM)
Da banco
JCM-7000
Convenzionali
JSM-IT210
JSM-IT510
Emissione di campo
JSM-IT710 HR
JSM-IT810
Risonanza Magnetica Nucleare (NMR)
Magneti Superconduttori
Spettrometri
Sonde per analisi in soluzione
Sonde criogeniche
Sonde per analisi allo stato solido
Software di controllo e processing
Accessori NMR
Dualbeams (FIB-SEM)
JIB-PS500i
Analisi Elementare
Gather-X EDS
SXES
Microscopi Elettronici a Trasmissione (TEM)
120kV
JEM-120i
200kV
JEM-2100Plus
JEM-F200
NEOARM
300kV
GRAND ARM™ 2
CRYO TEM
CRYO ARM™ 200
CRYO ARM™ 300 II
Microsonda elettronica (EPMA)
JXA-iSP100
JXA-iHP200F (FE-EPMA)
Strumenti di preparativa del campione
JEOL IB-19530CP Cross Section Polisher
JEOL EC-32010CC Carbon Coater
JEOL Smart Coater
Assistenza Tecnica
Applicazioni
FAQ
Contatti
L’azienda
Politica Aziendale
Codice Etico
Certificazioni
Prodotti
Microscopi Elettronici a Scansione (SEM)
Da banco
JCM-7000
Convenzionali
JSM-IT210
JSM-IT510
Emissione di campo
JSM-IT710 HR
JSM-IT810
Risonanza Magnetica Nucleare (NMR)
Magneti Superconduttori
Spettrometri
Sonde per analisi in soluzione
Sonde criogeniche
Sonde per analisi allo stato solido
Software di controllo e processing
Accessori NMR
Dualbeams (FIB-SEM)
JIB-PS500i
Analisi Elementare
Gather-X EDS
SXES
Microscopi Elettronici a Trasmissione (TEM)
120kV
JEM-120i
200kV
JEM-2100Plus
JEM-F200
NEOARM
300kV
GRAND ARM™ 2
CRYO TEM
CRYO ARM™ 200
CRYO ARM™ 300 II
Microsonda elettronica (EPMA)
JXA-iSP100
JXA-iHP200F (FE-EPMA)
Strumenti di preparativa del campione
JEOL IB-19530CP Cross Section Polisher
JEOL EC-32010CC Carbon Coater
JEOL Smart Coater
Assistenza Tecnica
Applicazioni
FAQ
Contatti
Battery
TEM
Minimum fringe illumination and aberration-free image shift on the JEOL CRYO ARM™
1 file
310.20 KB
Download
IDES – Luminary tech_JEOL TEMs
1 file
508.65 KB
Download
IDES_Tech note3_EDMSynchrony_JEOL TEMs
1 file
751.61 KB
Download
Hinting at hydrogens in JEOL CRYO ARM™ data
2 file
828.57 KB
Download
F200 Smart Design – Ergonomics
1 file
1.01 MB
Download
F200 Improved EELS
1 file
855.89 KB
Download
F200 EDS
1 file
945.82 KB
Download
F200 3D Tomography
1 file
814.97 KB
Download
F200 Multi-purpose Electron Microscope
1 file
1.96 MB
Download
Atomic resolution structures of biological macromolecules using microED on JEOL TEMs
1 file
765.79 KB
Download
1
2
3
SEM
Resolution in SEM JEOL Nanopix
1 file
525.66 KB
Download
Resolution in SEM
1 file
222.29 KB
Download
Qmap Quantitative Hyperspectral Imaging
1 file
593.10 KB
Download
JEOL Cryo-SEM Holder
1 file
462.44 KB
Download
SEM 3D Surface Reconstruction
1 file
475.03 KB
Download
Particle Analysis 3
1 file
235.20 KB
Download
NeoScope SEM Live 3D.
1 file
534.81 KB
Download
STEM-in-SEM – Analysis of Biological Specimens
1 file
526.43 KB
Download
Nanoscale analysis with STEM
1 file
272.34 KB
Download
Nanoscale Analysis Tech Note
1 file
851.74 KB
Download
1
2
3
4
NMR
Occupied or Emptied Sites Analysis of Lithium Titanium Oxide Anodes
1 file
289.31 KB
Download
Observation of NOE by HSQC-NOESY
1 file
821.47 KB
Download
Non Uniform Sampling in Routine 2D Correlation Experiments
1 file
1.46 MB
Download
NOAH-NMR Supersequences
1 file
911.21 KB
Download
NMR software DeltaV5.3.1 – Introduction of new features -pure shift (2) – TOCSY
1 file
355.45 KB
Download
NMR software DeltaV5.3.1 – Introduction of new features – pure shift (3) – HOBS
1 file
393.43 KB
Download
NMR software DeltaV5.3.1 – Introduction of new features – pure shift (1) – PSYCHE
1 file
376.58 KB
Download
Need for high resolution 2D spectra
1 file
410.05 KB
Download
JEOL Structure Elucidation of Fluorinated Compounds by NMR
1 file
1.58 MB
Download
JEOL ROYAL HFX Probe
1 file
1.84 MB
Download
1
2
3
4
JEOL news
Nome
Email
Invia
Errore:
Modulo di contatto non trovato.
